P4-CM-04K10D

The P4-CM-04K10D is a high-performance dual-line scan digital camera with a 4K resolution CMOS sensor and excellent image processing performance, designed for industrial inspection, precision measurement and automated production lines. With high-quality imaging and multi-functional interfaces, it can meet the needs of a variety of complex scenarios and provide stable and efficient support for industrial vision systems.

• 4K ultra-high-definition resolution

Equipped with a 4096 × 2 high-resolution image sensor, ensuring that each frame of the image has excellent detail restoration capabilities.

Widely applicable to scenarios requiring precise image acquisition, such as electronic component detection and high-precision measurement.

• High frame rate, adapted to dynamic detection

Supports 100/200kHz high-speed acquisition, which can increase the speed and quickly capture the target object detection.

Stable image quality is maintained in high frame rate mode to avoid blur or frame loss caused by dynamic scenes.

• Advanced image sensing technology

Using global shutter technology, accurately capture fast-moving targets without smearing.

High dynamic range support ensures imaging effects in complex lighting environments, suitable for high-contrast scenes.

• Compact design, easy to integrate

The compact structure, with a size of 62mm × 62mm × 48mm, is easy to integrate into automation equipment.

Industrial-grade housing, with dust and shock resistance, can work stably for a long time in harsh environments.

• Rich image processing functions

Support automatic exposure, automatic gain, white balance adjustment and other functions to meet the needs of diverse detection scenarios.

Built-in noise reduction algorithm provides clearer image quality.

• Automotive industry

Appearance defect detection of parts, such as surface scratches and coating consistency.

Quality control and defect removal of high-speed assembly lines.

• Electronic manufacturing

PCB defect detection, such as solder joint quality analysis.

Dimension measurement and position calibration of components to ensure assembly accuracy.

• Semiconductor inspection

Wafer scratch detection and appearance analysis.

Precise measurement of the shape and size of tiny components.

• Logistics and sorting

Dimension measurement and barcode scanning of automatic sorting systems.

Shape detection and recognition of objects on high-speed conveyor belts.