PX-HC-16K04T

The PX-HC-16K04T line scan camera uses Teledyne DALSA's advanced multi-line CMOS technology to achieve a perfect combination of high speed, high sensitivity and ultra-low noise. The camera is equipped with a CameraLink HS interface, and combined with the Xtium CameraLink HS acquisition card, it can achieve high-speed and long-distance transmission of large amounts of data.

• Color CMOS TDI sensor: extremely high color reproduction, no additional algorithm processing required
• High-speed data acquisition: full-color mode with a downlink frequency of up to 40kHz, improving detection efficiency
• Flexible acquisition mode: select specific color channels to achieve higher acquisition speed
• Precise exposure control: ensure clear images in complex lighting environments
• HDR LUT support: provides high dynamic range lookup tables to enhance image contrast and detail performance
• Sub-pixel correction: automatic adjustment of parallax and spatial distortion to ensure high-precision detection
• Long-distance stable transmission: compatible with CX4 active optical fiber module, achieving 100-meter ultra-long-distance transmission, lossless and efficient

1. Automatic Optical Inspection (AOI)

In the quality inspection of PCB circuit boards and microelectronic components, PX-HC-16K04T achieves fast scanning through high line frequency (40kHz), combined with HDR LUT technology to ensure clear imaging of complex circuit patterns, accurately identify defects such as short circuits, open circuits or abnormal solder joints, and improve production yield.

2. Printing quality inspection

During high-speed printing, PX-HC-16K04T can capture high-resolution color images in real time, and rely on sub-pixel spatial correction to ensure color accuracy, help detect color deviation, alignment errors and printing defects, and ensure that products meet strict printing quality standards.

3. Semiconductor and wafer inspection

In semiconductor production, PX-HC-16K04T's precise exposure control and ultra-low noise CMOS sensor can clearly capture micron-level wafer structures, detect scratches, contamination or etching defects, and provide reliable protection for high-precision manufacturing.

4. Lithium battery and photovoltaic industry inspection

In the field of new energy, PX-HC-16K04T is suitable for the inspection of key components such as lithium battery pole pieces and solar cells. Its high dynamic range lookup table (HDR LUT) technology can enhance the contrast, making subtle defects (such as pinholes, cracks, uneven coating) clearly visible, and improving the inspection efficiency of the production line.